On the reliability of highly magnified micrographs for structural analysis in materials science

por Wortmann, Martin, Layland, Ashley Stephen, Frese, Natalie, Kahmann, Uwe, Grothe, Timo, Storck, Jan Lukas, Blachowicz, Tomasz, Grzybowski, Jacek, Hüsgen, Bruno, Ehrmann, Andrea
Publicado 2020