Self-arrangement of nanoparticles toward crystalline metal oxides with high surface areas and tunable 3D mesopores

por Lee, Hyung Ik, Lee, Yoon Yun, Kang, Dong-Uk, Lee, Kirim, Kwon, Young-Uk, Kim, Ji Man
Publicado 2016

Characteristics of ZrC Barrier Coating on SiC-Coated Carbon/Carbon Composite Developed by Thermal Spray Process

por Kang, Bo Ram, Kim, Ho Seok, Oh, Phil Yong, Lee, Jung Min, Lee, Hyung Ik, Hong, Seong Min
Publicado 2019

Addressing diffusion behavior and impact in an epoxy–amine cure system using molecular dynamics simulations

por Kwon, Sung Hyun, Kang, Haisu, Kim, Byeong-Joo, Lee, Hyung Ik, Lee, Jung Min, Kim, Jungchul, Lee, Seung Geol
Publicado 2023

Author Correction: Addressing diffusion behavior and impact in an epoxy–amine cure system using molecular dynamics simulations

por Kwon, Sung Hyun, Kang, Haisu, Kim, Byeong‑Joo, Lee, Hyung Ik, Lee, Jung Min, Kim, Jungchul, Lee, Seung Geol
Publicado 2023

Nanocrystalline ZnON; High mobility and low band gap semiconductor material for high performance switch transistor and image sensor application

por Lee, Eunha, Benayad, Anass, Shin, Taeho, Lee, HyungIk, Ko, Dong-Su, Kim, Tae Sang, Son, Kyoung Seok, Ryu, Myungkwan, Jeon, Sanghun, Park, Gyeong-Su
Publicado 2014

CORRIGENDUM: Nanocrystalline ZnON; High mobility and low band gap semiconductor material for high performance switch transistor and image sensor application

por Lee, Eunha, Benayad, Anass, Shin, Taeho, Lee, HyungIk, Ko, Dong-Su, Kim, Tae Sang, Son, Kyoung Seok, Ryu, Myungkwan, Jeon, Sanghun, Park, Gyeong-Su
Publicado 2014

Degradation by water vapor of hydrogenated amorphous silicon oxynitride films grown at low temperature

por Lee, Hyung-Ik, Park, Jong-Bong, Xianyu, Wenxu, Kim, Kihong, Chung, Jae Gwan, Kyoung, Yong Koo, Byun, Sunjung, Yang, Woo Young, Park, Yong Young, Kim, Seong Min, Cho, Eunae, Shin, Jai Kwang
Publicado 2017

High-performance and scalable metal-chalcogenide semiconductors and devices via chalco-gel routes

por Kwon, Sung Min, Won, Jong Kook, Jo, Jeong-Wan, Kim, Jaehyun, Kim, Hee-Joong, Kwon, Hyuck-In, Kim, Jaekyun, Ahn, Sangdoo, Kim, Yong-Hoon, Lee, Myoung-Jae, Lee, Hyung-ik, Marks, Tobin J., Kim, Myung-Gil, Park, Sung Kyu
Publicado 2018

Direct evidence of flat band voltage shift for TiN/LaO or ZrO/SiO(2) stack structure via work function depth profiling

por Heo, Sung, Park, Hyoungsun, Ko, Dong-Su, Kim, Yong Su, Kyoung, Yong Koo, Lee, Hyung-Ik, Cho, Eunae, Lee, Hyo Sug, Park, Gyung-Su, Shin, Jai Kwang, Lee, Dongjin, Lee, Jieun, Jung, Kyoungho, Jeong, Moonyoung, Yamada, Satoru, Kang, Hee Jae, Choi, Byoung-Deog
Publicado 2017

Defect visualization of Cu(InGa)(SeS)(2) thin films using DLTS measurement

por Heo, Sung, Chung, JaeGwan, Lee, Hyung-Ik, Lee, Junho, Park, Jong-Bong, Cho, Eunae, Kim, KiHong, Kim, Seong Heon, Park, Gyeong Su, Lee, Dongho, Lee, Jaehan, Nam, Junggyu, Yang, JungYup, Lee, Dongwha, Cho, Hoon Young, Kang, Hee Jae, Choi, Pyung-Ho, Choi, Byoung-Deog
Publicado 2016