Effect of Annealing Process on the Properties of Ni(55%)Cr(40%)Si(5%) Thin-Film Resistors

por Cheng, Huan-Yi, Chen, Ying-Chung, Li, Pei-Jou, Yang, Cheng-Fu, Huang, Hong-Hsin
Publicado 2015

Developments of the Physical and Electrical Properties of NiCr and NiCrSi Single-Layer and Bi-Layer Nano-Scale Thin-Film Resistors

por Cheng, Huan-Yi, Chen, Ying-Chung, Li, Chi-Lun, Li, Pei-Jou, Houng, Mau-Phon, Yang, Cheng-Fu
Publicado 2016