RTN and Annealing Related to Stress and Temperature in FIND RRAM Array

por Chen, Chih Yuan, Lin, Chrong Jung, King, Ya-Chin
Publicado 2019

A study of hydrogen plasma-induced charging effect in EUV lithography systems

por Huang, Yao-Hung, Lin, Chrong Jung, King, Ya-Chin
Publicado 2023

Test Pattern Design for Plasma Induced Damage on Inter-Metal Dielectric in FinFET Cu BEOL Processes

por Su, Chi, Tsai, Yi-Pei, Lin, Chrong-Jung, King, Ya-Chin
Publicado 2020

Charge Splitting In Situ Recorder (CSIR) for Real-Time Examination of Plasma Charging Effect in FinFET BEOL Processes

por Tsai, Yi-Pei, Hsieh, Ting-Huan, Lin, Chrong Jung, King, Ya-Chin
Publicado 2017

Correction to: Charge Splitting In Situ Recorder (CSIR) for Real-Time Examination of Plasma Charging Effect in FinFET BEOL Processes

por Tsai, Yi-Pei, Hsieh, Ting-Huan, Lin, Chrong Jung, King, Ya-Chin
Publicado 2017

A Study of the Variability in Contact Resistive Random Access Memory by Stochastic Vacancy Model

por Kao, Yun-Feng, Zhuang, Wei Cheng, Lin, Chrong-Jung, King, Ya-Chin
Publicado 2018

An Early Detection Circuit for Endurance Enhancement of Backfilled Contact Resistive Random Access Memory Array

por Kao, Yun-Feng, Shih, Jiaw-Ren, Lin, Chrong Jung, King, Ya-Chin
Publicado 2021

Wide range detector of plasma induced charging effect for advanced CMOS BEOL processes

por Chao, Yi-Jie, Yang, Kai-Wei, Su, Chi, Lin, Chrong-Jung, King, Ya-Chin
Publicado 2021

CMOS compatible 2T pixel for on-wafer in-situ EUV detection

por Lin, Wei-Hwa, Huang, Han-Lin, Wu, Pin-Jiun, Lin, Chrong-Jung, King, Ya-Chin
Publicado 2023

A RRAM Integrated 4T SRAM with Self-Inhibit Resistive Switching Load by Pure CMOS Logic Process

por Hsu, Meng-Yin, Liao, Chu-Feng, Shih, Yi-Hong, Lin, Chrong Jung, King, Ya-Chin
Publicado 2017

Detectors Array for In Situ Electron Beam Imaging by 16-nm FinFET CMOS Technology

por Wang, Chien-Ping, Lin, Burn Jeng, Shih, Jiaw-Ren, Chih, Yue-Der, Chang, Jonathan, Lin, Chrong Jung, King, Ya-Chin
Publicado 2021

Dynamic pH Sensor with Embedded Calibration Scheme by Advanced CMOS FinFET Technology

por Wang, Chien-Ping, Shen, Ying-Chun, Liou, Peng-Chun, Chueh, Yu-Lun, Chih, Yue-Der, Chang, Jonathan, Lin, Chrong-Jung, King, Ya-Chin
Publicado 2019

Embedded Micro-detectors for EUV Exposure Control in FinFET CMOS Technology

por Wang, Chien-Ping, Lin, Burn Jeng, Wu, Pin-Jiun, Shih, Jiaw-Ren, Chih, Yue-Der, Chang, Jonathan, Lin, Chrong Jung, King, Ya-Chin
Publicado 2022

Retention Model of TaO/HfO(x) and TaO/AlO(x) RRAM with Self-Rectifying Switch Characteristics

por Lin, Yu-De, Chen, Pang-Shiu, Lee, Heng-Yuan, Chen, Yu-Sheng, Rahaman, Sk. Ziaur, Tsai, Kan-Hsueh, Hsu, Chien-Hua, Chen, Wei-Su, Wang, Pei-Hua, King, Ya-Chin, Lin, Chrong Jung
Publicado 2017