Formation of Nanocomposites by Oxidizing Annealing of SiO(x) and SiO(x)<Er,F> Films: Ellipsometry and FTIR Analysis

por Sopinskyy, Mykola V, Vlasenko, Natalya A, Lisovskyy, Igor P, Zlobin, Sergii O, Tsybrii, Zinoviia F, Veligura, Lyudmyla I
Publicado 2015