Comprehensive Investigation of Constant Voltage Stress Time-Dependent Breakdown and Cycle-to-Breakdown Reliability in Y-Doped and Si-Doped HfO(2) Metal-Ferroelectric-Metal Memory

por Chang, Ting-Yu, Wang, Kuan-Chi, Liu, Hsien-Yang, Hseun, Jing-Hua, Peng, Wei-Cheng, Ronchi, Nicolò, Celano, Umberto, Banerjee, Kaustuv, Van Houdt, Jan, Wu, Tian-Li
Publicado 2023