Improving the precision of optical metrology by detecting fewer photons with biased weak measurement

por Yin, Peng, Zhang, Wen-Hao, Xu, Liang, Liu, Ze-Gang, Zhuang, Wei-Feng, Chen, Lei, Gong, Ming, Ma, Yu, Peng, Xing-Xiang, Li, Gong-Chu, Xu, Jin-Shi, Zhou, Zong-Quan, Zhang, Lijian, Chen, Geng, Li, Chuan-Feng, Guo, Guang-Can
Publicado 2021