Computational Study of MoS(2)/HfO(2) Defective Interfaces for Nanometer-Scale Electronics

por KC, Santosh, Longo, Roberto C., Wallace, Robert M., Cho, Kyeongjae
Publicado 2017

Electronic properties of MoS(2)/MoO(x) interfaces: Implications in Tunnel Field Effect Transistors and Hole Contacts

por K. C., Santosh, Longo, Roberto C., Addou, Rafik, Wallace, Robert M., Cho, Kyeongjae
Publicado 2016

Increasing the Strain Resistance of Si/SiO(2) Interfaces for Flexible Electronics

por Mohammadi Hafshejani, Tahereh, Mahmood, Ammar, Wohlgemuth, Jonas, Koenig, Meike, Longo, Roberto C., Thissen, Peter
Publicado 2023