X-ray based tools for the investigation of buried interfaces in organic electronic devices

por Neuhold, Alfred, Brandner, Hannes, Ausserlechner, Simon J., Lorbek, Stefan, Neuschitzer, Markus, Zojer, Egbert, Teichert, Christian, Resel, Roland
Publicado 2013

Imaging ultra thin layers with helium ion microscopy: Utilizing the channeling contrast mechanism

por Hlawacek, Gregor, Veligura, Vasilisa, Lorbek, Stefan, Mocking, Tijs F, George, Antony, van Gastel, Raoul, Zandvliet, Harold J W, Poelsema, Bene
Publicado 2012