Direct Determination of 3D Distribution of Elemental Composition in Single Semiconductor Nanoislands by Scanning Auger Microscopy

por Ponomaryov, Semyon S., Yukhymchuk, Volodymyr O., Lytvyn, Peter M., Valakh, Mykhailo Ya
Publicado 2016

Low-Temperature Reduction of Graphene Oxide: Electrical Conductance and Scanning Kelvin Probe Force Microscopy

por Slobodian, Oleksandr M., Lytvyn, Peter M., Nikolenko, Andrii S., Naseka, Victor M., Khyzhun, Oleg Yu., Vasin, Andrey V., Sevostianov, Stanislav V., Nazarov, Alexei N.
Publicado 2018