Contactless, nondestructive determination of dopant profiles of localized boron-diffused regions in silicon wafers at room temperature

por Nguyen, Hieu T., Li, Zhuofeng, Han, Young-Joon, Basnet, Rabin, Tebyetekerwa, Mike, Truong, Thien N., Wu, Huiting, Yan, Di, Macdonald, Daniel
Publicado 2019

Supertransport of excitons in atomically thin organic semiconductors at the 2D quantum limit

por Sharma, Ankur, Zhang, Linglong, Tollerud, Jonathan O., Dong, Miheng, Zhu, Yi, Halbich, Robert, Vogl, Tobias, Liang, Kun, Nguyen, Hieu T., Wang, Fan, Sanwlani, Shilpa, Earl, Stuart K., Macdonald, Daniel, Lam, Ping Koy, Davis, Jeffrey A., Lu, Yuerui
Publicado 2020