Electrical Characterization of the Backside Interface on BSI Global Shutter Pixels with Tungsten-Shield Test Structures on CDTI Process

por Doyen, Célestin, Ricq, Stéphane, Magnan, Pierre, Marcelot, Olivier, Barlas, Marios, Place, Sébastien
Publicado 2020

Modeling, Simulation Methods and Characterization of Photon Detection Probability in CMOS-SPAD

por Panglosse, Aymeric, Martin-Gonthier, Philippe, Marcelot, Olivier, Virmontois, Cédric, Saint-Pé, Olivier, Magnan, Pierre
Publicado 2021

Leakage Current Non-Uniformity and Random Telegraph Signals in CMOS Image Sensor Floating Diffusions Used for In-Pixel Charge Storage

por Le Roch, Alexandre, Goiffon, Vincent, Marcelot, Olivier, Paillet, Philippe, Pace, Federico, Belloir, Jean-Marc, Magnan, Pierre, Virmontois, Cédric
Publicado 2019