On the Entropy of Oscillator-Based True Random Number Generators under Ionizing Radiation

por Martin, Honorio, Martin-Holgado, Pedro, Peris-Lopez, Pedro, Morilla, Yolanda, Entrena, Luis
Publicado 2018

Impact of Gamma Radiation on Dynamic R(DSON) Characteristics in AlGaN/GaN Power HEMTs

por Martínez, Pedro J., Maset, Enrique, Martín-Holgado, Pedro, Morilla, Yolanda, Gilabert, David, Sanchis-Kilders, Esteban
Publicado 2019

Thermal-to-high-energy neutron SEU characterization of commercial SRAMs

por Coronetti, Andrea, Garcia Alia, Ruben, Letiche, Manon, Cazzaniga, Carlo, Kastriotou, Maria, Cecchetto, Matteo, Bilko, Kacper, Martin-Holgado, Pedro
Publicado 2021

Measurements of Low-Energy Protons Using a Silicon Detector for Application to SEE Testing

por Cazzaniga, Carlo, Alía, Rubén García, Coronetti, Andrea, Bilko, Kacper, Morilla, Yolanda, Martin-Holgado, Pedro, Kastriotou, Maria, Frost, Christopher D
Publicado 2021

Silicon solid-state detectors for monitoring high-energy accelerator mixed field radiation environments

por Biłko, Kacper, García Alía, Rubén, Sacristán Barbero, Mario, Prelipcean, Daniel, Cazzaniga, Carlo, Coronetti, Andrea, Martín-Holgado, Pedro, Morilla García, Yolanda, Lerner, Giuseppe, Hajdas, Wojciech
Publicado 2021

How the Analysis of Archival Data Could Provide Helpful Information About TID Degradation. Case Study: Bipolar Transistors

por Martín-Holgado, Pedro, Romero-Maestre, Amor, de-Martín-Hernández, José, González-Luján, José J, Illera-Gómez, Iván, Jiménez-de-Luna, Yolanda, Morilla, Fernando, Barbero, Mario Sacristan, Garcia Alia, Rubén, Domínguez, Manuel, Morilla, Yolanda
Publicado 2022

Direct Ionization Impact on Accelerator Mixed-Field Soft-Error Rate

por García Alía, Rubén, Tali, Maris, Brugger, Markus, Cecchetto, Matteo, Cerutti, Francesco, Cononetti, Andrea, Danzeca, Salvatore, Esposito, Luigi, Fernández-Martínez, Pablo, Gilardoni, Simone, Infantino, Angelo, Kastriotou, Maria, Kerboub, Nourdine, Lerner, Giuseppe, Wyrwoll, Vanessa, Ferlet-Cavrois, Véronique, Boatella, César, Javanainen, Arto, Kettunen, Heikki, Morilla, Yolanda, Martín-Holgado, Pedro, Gaillard, Rémi, Wrobel, Frédéric, Cazzaniga, Carlo, Alexandrescu, Dan, Glorieux, Maximilien, Puchner, Helmut
Publicado 2019

SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below

por Coronetti, Andrea, Cecchetto, Matteo, Wang, Jialei, Tali, Maris, Martinez, Pablo Fernandez, Kastriotou, Maria, Papadopoulou, Athina, Bilko, Kacper, Castellani, Florent, Sacristan, Mario, Alia, Ruben Garcia, Cazzaniga, Carlo, Morilla, Yolanda, Martin-Holgado, Pedro, van Goethem, Marc-Jan, Kiewiet, Harry, van der Graaf, Emil, Brandenburg, Sytze, Hajdas, Wojtek, Sinkunaite, Laura, Marszalek, Miroslaw, Kettunen, Heikki, Rossi, Mikko, Jaatinen, Jukka, Javanainen, Arto, Moscatello, Marie-Helene, Dubois, Anthony, Fiore, Salvatore, Bazzano, Giulia, Frost, Christopher, Letiche, Manon, Farabolini, Wilfrid, Gilardi, Antonio, Corsini, Roberto, Puchner, Helmut
Publicado 2020