Nondestructive X-ray diffraction measurement of warpage in silicon dies embedded in integrated circuit packages

por Tanner, B. K., Danilewsky, A. N., Vijayaraghavan, R. K., Cowley, A., McNally, P. J.
Publicado 2017

On the correlation between crystal morphology and X-ray performance of a CdZnTe detector

por Bavdaz, M, Peacock, A, Nenonen, S, Jantunen, M A, Gagliardi, T, Tuomi, T, Hjelt, K T, Juvonen, M, Rantamäki, R, Kraft, S, Wedowski, M, Scholze, F, Ulm, G, McNally, P J, Curley, J, Danilewsky, A N
Publicado 1997