Quantized conductance coincides with state instability and excess noise in tantalum oxide memristors

por Yi, Wei, Savel'ev, Sergey E., Medeiros-Ribeiro, Gilberto, Miao, Feng, Zhang, M.-X., Yang, J. Joshua, Bratkovsky, Alexander M., Williams, R. Stanley
Publicado 2016

Characterization of electroforming-free titanium dioxide memristors

por Strachan, John Paul, Yang, J Joshua, Montoro, L A, Ospina, C A, Ramirez, A J, Kilcoyne, A L D, Medeiros-Ribeiro, Gilberto, Williams, R Stanley
Publicado 2013

The limits of near field immersion microwave microscopy evaluated by imaging bilayer graphene moiré patterns

por Ohlberg, Douglas A. A., Tami, Diego, Gadelha, Andreij C., Neto, Eliel G. S., Santana, Fabiano C., Miranda, Daniel, Avelino, Wellington, Watanabe, Kenji, Taniguchi, Takashi, Campos, Leonardo C., Ramirez, Jhonattan C., do Rego, Cássio Gonçalves, Jorio, Ado, Medeiros-Ribeiro, Gilberto
Publicado 2021