Temperature mapping of operating nanoscale devices by scanning probe thermometry

por Menges, Fabian, Mensch, Philipp, Schmid, Heinz, Riel, Heike, Stemmer, Andreas, Gotsmann, Bernd
Publicado 2016

Kelvin probe force microscopy for local characterisation of active nanoelectronic devices

por Wagner, Tino, Beyer, Hannes, Reissner, Patrick, Mensch, Philipp, Riel, Heike, Gotsmann, Bernd, Stemmer, Andreas
Publicado 2015