In-Lens Band-Pass Filter for Secondary Electrons in Ultrahigh Resolution SEM

por Konvalina, Ivo, Mika, Filip, Krátký, Stanislav, Materna Mikmeková, Eliška, Müllerová, Ilona
Publicado 2019

Scanning Electron Microscopy with Samples in an Electric Field

por Frank, Ludĕk, Hovorka, Miloš, Mikmeková, Šárka, Mikmeková, Eliška, Müllerová, Ilona, Pokorná, Zuzana
Publicado 2012

Quantification of STEM Images in High Resolution SEM for Segmented and Pixelated Detectors

por Konvalina, Ivo, Paták, Aleš, Zouhar, Martin, Müllerová, Ilona, Fořt, Tomáš, Unčovský, Marek, Materna Mikmeková, Eliška
Publicado 2021

Low-Energy Electron Inelastic Mean Free Path of Graphene Measured by a Time-of-Flight Spectrometer

por Konvalina, Ivo, Daniel, Benjamin, Zouhar, Martin, Paták, Aleš, Müllerová, Ilona, Frank, Luděk, Piňos, Jakub, Průcha, Lukáš, Radlička, Tomáš, Werner, Wolfgang S. M., Mikmeková, Eliška Materna
Publicado 2021