Further Increasing the Accuracy of Characterization of a Thin Dielectric or Semiconductor Film on a Substrate from Its Interference Transmittance Spectrum

por Minkov, Dorian, Marquez, Emilio, Angelov, George, Gavrilov, Gavril, Ruano, Susana, Saugar, Elias
Publicado 2021

Increasing the Accuracy of the Characterization of a Thin Semiconductor or Dielectric Film on a Substrate from Only One Quasi-Normal Incidence UV/Vis/NIR Reflectance Spectrum of th...

por Minkov, Dorian, Angelov, George, Marquez, Emilio, Radonov, Rossen, Rusev, Rostislav, Nikolov, Dimitar, Ruano, Susana
Publicado 2023

Optical Characterization of As(x)Te(100−x) Films Grown by Plasma Deposition Based on the Advanced Optimizing Envelope Method

por Minkov, Dorian, Angelov, George, Nestorov, Radi, Nezhdanov, Aleksey, Usanov, Dmitry, Kudryashov, Mikhail, Mashin, Aleksandr
Publicado 2020

Hybrid Dispersion Model Characterization of PAZO Azopolymer Thin Films over the Entire Transmittance Spectrum Measured in the UV/VIS/NIR Spectral Region

por Minkov, Dorian, Nedelchev, Lian, Angelov, George, Marquez, Emilio, Blagoeva, Blaga, Mateev, Georgi, Nazarova, Dimana
Publicado 2022