Improved atomic force microscopy cantilever performance by partial reflective coating

por Schumacher, Zeno, Miyahara, Yoichi, Aeschimann, Laure, Grütter, Peter
Publicado 2015

Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

por Mascaro, Aaron, Miyahara, Yoichi, Enright, Tyler, Dagdeviren, Omur E, Grütter, Peter
Publicado 2019

Amplitude Dependence of Resonance Frequency and its Consequences for Scanning Probe Microscopy

por Dagdeviren, Omur E., Miyahara, Yoichi, Mascaro, Aaron, Enright, Tyler, Grütter, Peter
Publicado 2019

Nanoscale force sensing of an ultrafast nonlinear optical response

por Schumacher, Zeno, Rejali, Rasa, Pachlatko, Raphael, Spielhofer, Andreas, Nagler, Philipp, Miyahara, Yoichi, Cooke, David G., Grütter, Peter
Publicado 2020