Odd electron diffraction patterns in silicon nanowires and silicon thin films explained by microtwins and nanotwins

por Cayron, Cyril, Den Hertog, Martien, Latu-Romain, Laurence, Mouchet, Céline, Secouard, Christopher, Rouviere, Jean-Luc, Rouviere, Emmanuelle, Simonato, Jean-Pierre
Publicado 2009

Conductive-probe atomic force microscopy characterization of silicon nanowire

por Alvarez, José, Ngo, Irène, Gueunier-Farret, Marie-Estelle, Kleider, Jean-Paul, Yu, Linwei, Cabarrocas, Pere Rocai, Perraud, Simon, Rouvière, Emmanuelle, Celle, Caroline, Mouchet, Céline, Simonato, Jean-Pierre
Publicado 2011