Characterization of dislocations in germanium layers grown on (011)- and (111)-oriented silicon by coplanar and noncoplanar X-ray diffraction

por Benediktovitch, Andrei, Zhylik, Alexei, Ulyanenkova, Tatjana, Myronov, Maksym, Ulyanenkov, Alex
Publicado 2015

N‐Type Doped Silicon Thin Film on a Porous Cu Current Collector as the Negative Electrode for Li‐Ion Batteries

por Mukanova, Aliya, Nurpeissova, Arailym, Kim, Sung‐Soo, Myronov, Maksym, Bakenov, Zhumabay
Publicado 2017

Characterization of SiGe thin films using a laboratory X-ray instrument

por Ulyanenkova, Tatjana, Myronov, Maksym, Benediktovitch, Andrei, Mikhalychev, Alexander, Halpin, John, Ulyanenkov, Alex
Publicado 2013

Uprooting defects to enable high-performance III–V optoelectronic devices on silicon

por Bioud, Youcef A., Boucherif, Abderraouf, Myronov, Maksym, Soltani, Ali, Patriarche, Gilles, Braidy, Nadi, Jellite, Mourad, Drouin, Dominique, Arès, Richard
Publicado 2019

Laser-vibrometric ultrasonic characterization of resonant modes and quality factors of Ge membranes

por Trushkevych, Oksana, A Shah, Vishal, Myronov, Maksym, E Halpin, John, D Rhead, Stephen, J Prest, Martin, R Leadley, David, S Edwards, Rachel
Publicado 2014

Heteroepitaxial Growth of Ferromagnetic MnSb(0001) Films on Ge/Si(111) Virtual Substrates

por Burrows, Christopher W., Dobbie, Andrew, Myronov, Maksym, Hase, Thomas P. A., Wilkins, Stuart B., Walker, Marc, Mudd, James J., Maskery, Ian, Lees, Martin R., McConville, Christopher F., Leadley, David R., Bell, Gavin R.
Publicado 2013