Redetermination of the crystal structure of R (5)Si(4) (R = Pr, Nd) from single-crystal X-ray diffraction data

por Yokota, Kaori, Watanuki, Ryuta, Nakashima, Miki, Uehara, Masatomo, Gouchi, Jun, Uwatoko, Yoshiya, Umehara, Izuru
Publicado 2020