Conductive-probe atomic force microscopy characterization of silicon nanowire

por Alvarez, José, Ngo, Irène, Gueunier-Farret, Marie-Estelle, Kleider, Jean-Paul, Yu, Linwei, Cabarrocas, Pere Rocai, Perraud, Simon, Rouvière, Emmanuelle, Celle, Caroline, Mouchet, Céline, Simonato, Jean-Pierre
Publicado 2011