Defect Inspection Techniques in SiC

por Chen, Po-Chih, Miao, Wen-Chien, Ahmed, Tanveer, Pan, Yi-Yu, Lin, Chun-Liang, Chen, Shih-Chen, Kuo, Hao-Chung, Tsui, Bing-Yue, Lien, Der-Hsien
Publicado 2022

Wide-range and area-selective threshold voltage tunability in ultrathin indium oxide transistors

por Tseng, Robert, Wang, Sung-Tsun, Ahmed, Tanveer, Pan, Yi-Yu, Chen, Shih-Chieh, Shih, Che-Chi, Tsai, Wu-Wei, Chen, Hai-Ching, Kei, Chi-Chung, Chou, Tsung-Te, Hung, Wen-Ching, Chen, Jyh-Chen, Kuo, Yi-Hou, Lin, Chun-Liang, Woon, Wei-Yen, Liao, Szuya Sandy, Lien, Der-Hsien
Publicado 2023