In Situ Force Microscopy to Investigate Fracture in Stretchable Electronics: Insights on Local Surface Mechanics and Conductivity

por Cortelli, Giorgio, Patruno, Luca, Cramer, Tobias, Fraboni, Beatrice, de Miranda, Stefano
Publicado 2022

Atomic Force Microscopy Nanomechanics of Hard Nanometer-Thick Films on Soft Substrates: Insights into Stretchable Conductors

por Cortelli, Giorgio, Patruno, Luca, Cramer, Tobias, Murgia, Mauro, Fraboni, Beatrice, de Miranda, Stefano
Publicado 2021

Direct imaging of defect formation in strained organic flexible electronics by Scanning Kelvin Probe Microscopy

por Cramer, Tobias, Travaglini, Lorenzo, Lai, Stefano, Patruno, Luca, de Miranda, Stefano, Bonfiglio, Annalisa, Cosseddu, Piero, Fraboni, Beatrice
Publicado 2016

Determination of Stiffness and the Elastic Modulus of 3D-Printed Micropillars with Atomic Force Microscopy–Force Spectroscopy

por Cortelli, Giorgio, Grob, Leroy, Patruno, Luca, Cramer, Tobias, Mayer, Dirk, Fraboni, Beatrice, Wolfrum, Bernhard, de Miranda, Stefano
Publicado 2023