Quantitative evaluation of microtwins and antiphase defects in GaP/Si nanolayers for a III–V photonics platform on silicon using a laboratory X-ray diffraction setup

por Ping Wang, Yan, Letoublon, Antoine, Nguyen Thanh, Tra, Bahri, Mounib, Largeau, Ludovic, Patriarche, Gilles, Cornet, Charles, Bertru, Nicolas, Le Corre, Alain, Durand, Olivier
Publicado 2015