Kelvin probe force microscopy of the nanoscale electrical surface potential barrier of metal/semiconductor interfaces in ambient atmosphere

por Knotek, Petr, Plecháček, Tomáš, Smolík, Jan, Kutálek, Petr, Dvořák, Filip, Vlček, Milan, Navrátil, Jiří, Drašar, Čestmír
Publicado 2019