Analytics-statistics mixed training and its fitness to semisupervised manufacturing

por Parashar, Parag, Chen, Chun Han, Akbar, Chandni, Fu, Sze Ming, Rawat, Tejender S., Pratik, Sparsh, Butola, Rajat, Chen, Shih Han, Lin, Albert S.
Publicado 2019

Mapping Oxidation and Wafer Cleaning to Device Characteristics Using Physics-Assisted Machine Learning

por Pratik, Sparsh, Liu, Po-Ning, Ota, Jun, Tu, Yen-Liang, Lai, Guan-Wen, Ho, Ya-Wen, Yang, Zheng-Kai, Rawat, Tejender Singh, Lin, Albert S.
Publicado 2022