5.5 MeV Electron Irradiation-Induced Transformation of Minority Carrier Traps in p-Type Si and Si(1−x)Ge(x) Alloys

por Pavlov, Jevgenij, Ceponis, Tomas, Pukas, Kornelijus, Makarenko, Leonid, Gaubas, Eugenijus
Publicado 2022

Study of Radiation-Induced Defects in p-Type Si(1−x)Ge(x) Diodes before and after Annealing

por Ceponis, Tomas, Lastovskii, Stanislau, Makarenko, Leonid, Pavlov, Jevgenij, Pukas, Kornelijus, Gaubas, Eugenijus
Publicado 2020

Transient Electrical and Optical Characteristics of Electron and Proton Irradiated SiGe Detectors

por Ceponis, Tomas, Deveikis, Laimonas, Lastovskii, Stanislau, Makarenko, Leonid, Pavlov, Jevgenij, Pukas, Kornelijus, Rumbauskas, Vytautas, Gaubas, Eugenijus
Publicado 2020