Increasing the Accuracy of the Characterization of a Thin Semiconductor or Dielectric Film on a Substrate from Only One Quasi-Normal Incidence UV/Vis/NIR Reflectance Spectrum of th...

por Minkov, Dorian, Angelov, George, Marquez, Emilio, Radonov, Rossen, Rusev, Rostislav, Nikolov, Dimitar, Ruano, Susana
Publicado 2023