Border Trap Characterizations of Al(2)O(3)/ZrO(2) and Al(2)O(3)/HfO(2) Bilayer Films Based on Ambient Post Metal Annealing and Constant Voltage Stress

por Rahman, Md. Mamunur, Kim, Dae-Hyun, Kim, Tae-Woo
Publicado 2020

Characterization of Electrical Traps Formed in Al(2)O(3) under Various ALD Conditions

por Rahman, Md. Mamunur, Shin, Ki-Yong, Kim, Tae-Woo
Publicado 2020

Border Trap Extraction with Capacitance- Equivalent Thickness to Reflect the Quantum Mechanical Effect on Atomic Layer Deposition High-k/In(0.53)Ga(0.47)As on 300-mm Si Substrate

por Rahman, Md. Mamunur, Kim, Jun-Gyu, Kim, Dae-Hyun, Kim, Tae-Woo
Publicado 2019

Characterization of Al Incorporation into HfO(2) Dielectric by Atomic Layer Deposition

por Rahman, Md. Mamunur, Kim, Jun-Gyu, Kim, Dae-Hyun, Kim, Tae-Woo
Publicado 2019

Causal Effect Analysis of Demographic Concordance of Physician Trust and Respect in an Emergency Care Setting

por Ho, Amy F, Zhou, Yuan, Kirby, Jessica J, Rahman, Md Mamunur, Tessitore, Kathryn, Abdel-Raziq, Yousef, d’Etienne, James P, Schrader, Chet D, Wang, Hao
Publicado 2021