Analytics-statistics mixed training and its fitness to semisupervised manufacturing

por Parashar, Parag, Chen, Chun Han, Akbar, Chandni, Fu, Sze Ming, Rawat, Tejender S., Pratik, Sparsh, Butola, Rajat, Chen, Shih Han, Lin, Albert S.
Publicado 2019

Meta-Learned and TCAD-Assisted Sampling in Semiconductor Laser Annealing

por Rawat, Tejender Singh, Chang, Chung Yuan, Feng, Yen-Wei, Chen, ShihWei, Shen, Chang-Hong, Shieh, Jia-Min, Lin, Albert Shihchun
Publicado 2022

Mapping Oxidation and Wafer Cleaning to Device Characteristics Using Physics-Assisted Machine Learning

por Pratik, Sparsh, Liu, Po-Ning, Ota, Jun, Tu, Yen-Liang, Lai, Guan-Wen, Ho, Ya-Wen, Yang, Zheng-Kai, Rawat, Tejender Singh, Lin, Albert S.
Publicado 2022