Functional Testing and Characterisation of ISFETs on Wafer Level by Means of a Micro-droplet Cell(#)

por Poghossian, Arshak, Schumacher, Kerstin, Kloock, Joachim P., Rosenkranz, Christian, Schultze, Joachim W., Müller-Veggian, Mattea, Schöning, Michael J.
Publicado 2006