Pinch-Off Formation in Monolayer and Multilayers MoS(2) Field-Effect Transistors

por Vaknin, Yonatan, Dagan, Ronen, Rosenwaks, Yossi
Publicado 2019

Schottky Barrier Height and Image Force Lowering in Monolayer MoS(2) Field Effect Transistors

por Vaknin, Yonatan, Dagan, Ronen, Rosenwaks, Yossi
Publicado 2020

NATO Advanced Study Institute on Scanning Probe Microscopy : Characterization, Nanofabrication and Device Application of Functional Materials

por Vilarinho, Paula Maria, Rosenwaks, Yossi, Kingon, Angus
Publicado 2005

The electronic structure of metal oxide/organo metal halide perovskite junctions in perovskite based solar cells

por Dymshits, Alex, Henning, Alex, Segev, Gideon, Rosenwaks, Yossi, Etgar, Lioz
Publicado 2015

The role of the cantilever in Kelvin probe force microscopy measurements

por Elias, George, Glatzel, Thilo, Meyer, Ernst, Schwarzman, Alex, Boag, Amir, Rosenwaks, Yossi
Publicado 2011

Kelvin probe force microscopy of nanocrystalline TiO(2) photoelectrodes

por Henning, Alex, Günzburger, Gino, Jöhr, Res, Rosenwaks, Yossi, Bozic-Weber, Biljana, Housecroft, Catherine E, Constable, Edwin C, Meyer, Ernst, Glatzel, Thilo
Publicado 2013