Determination of atomic vacancies in InAs/GaSb strained-layer superlattices by atomic strain

por Kim, Honggyu, Meng, Yifei, Kwon, Ji-Hwan, Rouviére, Jean-Luc, Zuo, Jian Min
Publicado 2018

Practice of electron microscopy on nanoparticles sensitive to radiation damage: CsPbBr(3) nanocrystals as a case study

por Duong, Tuan M., Sharma, Kshipra, Agnese, Fabio, Rouviere, Jean-Luc, Okuno, Hanako, Pouget, Stéphanie, Reiss, Peter, Ling, Wai Li
Publicado 2022

Odd electron diffraction patterns in silicon nanowires and silicon thin films explained by microtwins and nanotwins

por Cayron, Cyril, Den Hertog, Martien, Latu-Romain, Laurence, Mouchet, Céline, Secouard, Christopher, Rouviere, Jean-Luc, Rouviere, Emmanuelle, Simonato, Jean-Pierre
Publicado 2009

In Situ Transmission Electron Microscopy Analysis of Aluminum–Germanium Nanowire Solid-State Reaction

por El hajraoui, Khalil, Luong, Minh Anh, Robin, Eric, Brunbauer, Florian, Zeiner, Clemens, Lugstein, Alois, Gentile, Pascal, Rouvière, Jean-Luc, Den Hertog, Martien
Publicado 2019