Artifact identification in X-ray diffraction data using machine learning methods

por Yanxon, Howard, Weng, James, Parraga, Hannah, Xu, Wenqian, Ruett, Uta, Schwarz, Nicholas
Publicado 2023

Local atomic structure of thin and ultrathin films via rapid high-energy X-ray total scattering at grazing incidence

por Dippel, Ann-Christin, Roelsgaard, Martin, Boettger, Ulrich, Schneller, Theodor, Gutowski, Olof, Ruett, Uta
Publicado 2019

In situ X-ray area detector flat-field correction at an operating photon energy without flat illumination

por Weng, James, Xu, Wenqian, Wiaderek, Kamila M., Borkiewicz, Olaf J., Chen, Jahui, Von Dreele, Robert B., Gallington, Leighanne C., Ruett, Uta
Publicado 2023

In situ X-ray area detector flat-field correction at an operating photon energy without flat illumination. Corrigendum

por Weng, James, Xu, Wenqian, Wiaderek, Kamila M., Borkiewicz, Olaf J., Chen, Jiahui, Von Dreele, Robert B., Gallington, Leighanne C., Ruett, Uta
Publicado 2023