SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below

por Coronetti, Andrea, Cecchetto, Matteo, Wang, Jialei, Tali, Maris, Martinez, Pablo Fernandez, Kastriotou, Maria, Papadopoulou, Athina, Bilko, Kacper, Castellani, Florent, Sacristan, Mario, Alia, Ruben Garcia, Cazzaniga, Carlo, Morilla, Yolanda, Martin-Holgado, Pedro, van Goethem, Marc-Jan, Kiewiet, Harry, van der Graaf, Emil, Brandenburg, Sytze, Hajdas, Wojtek, Sinkunaite, Laura, Marszalek, Miroslaw, Kettunen, Heikki, Rossi, Mikko, Jaatinen, Jukka, Javanainen, Arto, Moscatello, Marie-Helene, Dubois, Anthony, Fiore, Salvatore, Bazzano, Giulia, Frost, Christopher, Letiche, Manon, Farabolini, Wilfrid, Gilardi, Antonio, Corsini, Roberto, Puchner, Helmut
Publicado 2020