BPW34 Commercial p-i-n Diodes for High-Level 1-MeV Neutron Equivalent Fluence Monitoring

por Ravotti, F, Glaser, M, Moll, M, Saigne, F
Publicado 2008

Prediction of the Thermal Annealing of Thick Oxide Metal-Oxide-Semiconductor Dosimeters Irradiated in a Harsh Radiation Environment

por Ravotti, F, Glaser, M, Saigné, F, Dusseau, L, Sarrabayrouse, G
Publicado 2006

Soft errors in commercial off-the-shelf static random access memories

por Dilillo, L, Tsiligiannis, G, Gupta, V, Bosser, A, Saigne, F, Wrobel, F
Publicado 2017

Radiation Effects on Deep Submicrometer SRAM-based FPGAs under the CERN Mixed-Field Radiation Environment

por Tsiligiannis, G, Danzeca, S, Garcia-Alia, R, Infantino, A, Lesea, A, Brugger, M, Masi, A, Gilardoni, S, Saigné, F
Publicado 2018

Heavy Ion SEU Cross Section Calculation Based on Proton Experimental Data, and Vice Versa

por Wrobel, F, Touboul, A D, Pouget, V, Dilillo, L, Ecoffet, R, Lorfèvre, E, Bezerra, F, Brugger, M, Saigné, F
Publicado 2014

Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

por Bosser, A, Gupta, V, Tsiligiannis, G, Javanainen, A, Kettunen, H, Puchner, H, Saigne, F, Virtanen, A, Wrobel, F, Dilillo, L
Publicado 2015

Heavy-Ion Radiation Impact on a 4Mb FRAM under Different Test Conditions

por Gupta, V., Bosser, A., Tsiligiannis, G., Zadeh, A., Javanainen, A., Virtanen, A., Puchner, H., Saigne, F., Wrobel, F., Dilillo, L.
Publicado 2015

Energy Dependence of Tungsten-Dominated SEL Cross Sections

por Alia, R G, Brugger, M, Danzeca, S, Ferlet-Cavrois, V, Poivey, C, Roed, K, Saigné, F, Spiezia, G, Uznanski, S, Wrobel, F
Publicado 2014

Evaluating a radiation monitor for mixed-field environments based on SRAM technology

por Tsiligiannis, G, Dilillo, L, Bosio, A, Girard, P, Pravossoudovitch, S, Todri, A, Virazel, A, Mekki, J, Brugger, M, Wrobel, F, Saigne, F
Publicado 2014

An SRAM Based Monitor for Mixed-Field Radiation Environments

por Tsiligiannis, G, Dilillo, L, Bosio, A, Girard, P, Pravossoudovitch, S, Todri, A, Virazel, A, Mekki, J, Brugger, M, Wrobel, F, Saigné, F
Publicado 2014

SEE on Different Layers of Stacked-SRAMs

por Gupta, V, Bosser, A, Tsiligiannis, G, Rousselet, M, Mohammadzadeh, A, Javanainen, A, Virtanen, A, Puchner, H, Saigné, F, Wrobel, F, Dilillo, L
Publicado 2015

High-energy particle irradiation of optically stimulated luminescent films at CERN

por Dusseau, L, Polge, G, Mathias, S, Vaillé, J R, Germanicus, R, Broadhead, R, Camanzi, B, Glaser, M, Saigne, F, Fesquet, J, Gasiot, J
Publicado 2001

A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing

por Bosser, A., Gupta, V., Tsiligiannis, G., Ferraro, R., Frost, C., Javanainen, A., Puchner, H., Rossi, M., Saigne, F., Virtanen, A., Wrobel, F., Zadeh, A., Dilillo, L.
Publicado 2015

Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random-Access Memory

por Bosser, A L, Gupta, V, Javanainen, A, Tsiligiannis, G, La Lumondiere, S D, Brewe, D, Ferlet-Cavrois, V, Puchner, H, Kettunen, H, Gil, T, Wrobel, F, Saigné, F, Virtanen, A, Dilillo, L
Publicado 2018