Probing carrier lifetimes in photovoltaic materials using subsurface two-photon microscopy

por Barnard, Edward S., Hoke, Eric T., Connor, Stephen T., Groves, James R., Kuykendall, Tevye, Yan, Zewu, Samulon, Eric C., Bourret-Courchesne, Edith D., Aloni, Shaul, Schuck, P. James, Peters, Craig H., Hardin, Brian E.
Publicado 2013