Soft X-ray reflectivity: from quasi-perfect mirrors to accelerator walls

por Schäfers, F., Cimino, R.
Publicado 2013

Corrigendum: Determining Chemically and Spatially Resolved Atomic Profile of Low Contrast Interface Structure with High Resolution

por Nayak, Maheswar, Pradhan, P. C., Lodha, G. S., Sokolov, A., Schäfers, F.
Publicado 2016

Erratum: Determining Chemically and Spatially Resolved Atomic Profile of Low Contrast Interface Structure with High Resolution

por Nayak, Maheswar, Pradhan, P. C., Lodha, G. S., Sokolov, A., Schäfers, F.
Publicado 2016

Efficient high-order suppression system for a metrology beamline

por Sokolov, A., Sertsu, M. G., Gaupp, A., Lüttecke, M., Schäfers, F.
Publicado 2018

Soft X-ray Reflection Spectroscopy for Nano-Scaled Layered Structure Materials

por Majhi, A., Nayak, Maheswar, Pradhan, P. C., Filatova, E. O., Sokolov, A., Schäfers, F.
Publicado 2018

A Superconducting 7T Multipole Wiggler for the BESSY II Synchrotron Radiation Source

por Weihreter, E, Schäfers, F, Scheer, M, Fedurin, M G, Mezentsev, M, Shkaruba, V A, Mhaskar, S P, Berger, D
Publicado 2001

Photo reflectivity and photo electron yield from technical surfaces

por Liedl, A, Angelucci, M, La Francesca, E, Schäfers, F, Sertsu, M G, Siewert, F, Sokolov, A, Cimino, R
Publicado 2020

The at-wavelength metrology facility for UV- and XUV-reflection and diffraction optics at BESSY-II

por Schäfers, F., Bischoff, P., Eggenstein, F., Erko, A., Gaupp, A., Künstner, S., Mast, M., Schmidt, J.-S., Senf, F., Siewert, F., Sokolov, A., Zeschke, Th.
Publicado 2016

Reflectivity and photoelectron yield from copper in accelerators

por La Francesca, E, Angelucci, M, Liedl, A, Spallino, L, Gonzalez, L A, Bellafont, I, Siewert, F, Sertsu, M G, Sokolov, A, Schäfers, F, Cimino, R
Publicado 2020

Gratings for synchrotron and FEL beamlines: a project for the manufacture of ultra-precise gratings at Helmholtz Zentrum Berlin

por Siewert, F., Löchel, B., Buchheim, J., Eggenstein, F., Firsov, A., Gwalt, G., Kutz, O., Lemke, St., Nelles, B., Rudolph, I., Schäfers, F., Seliger, T., Senf, F., Sokolov, A., Waberski, Ch., Wolf, J., Zeschke, T., Zizak, I., Follath, R., Arnold, T., Frost, F., Pietag, F., Erko, A.
Publicado 2018