Fission lifetime measured by the blocking technique as a function of excitation energy in the 24 A.MeV $^{238}U + ^{28}Si$ reaction

por Morjean, M, Chevallier, M, Cohen, C, Dauvergne, D, Dural, J, Galin, J, Goldenbaum, F, Jacquet, D, Kirsch, R, Liénard, E, Lott, B, Peghaire, A, Périer, Y, Poizat, J C, Prevot, G, Rémillieux, Joseph, Schmaus, D, Toulemonde, M
Publicado 1997

Study of K-REC with bare 60 MeV\/u Kr ions channeled in a Si crystal: experiments and simulations

por Andriamonje, Samuel A, Chevallier, M, Cohen, C, Cue, N, Dauvergne, D, Dural, J, Fujimoto, F, Kirsch, R, L'Hoir, A, Poizat, J C, Quéré, Y, Rémillieux, Joseph, Röhl, C, Rothard, H, Rozet, J P, Schmaus, D, Toulemonde, M, Vernhet, D
Publicado 1996

Charge states and energy loss of 300 MeV/u U$^{73+}$ ions channeled in a silicon crystal

por Dauvergne, D, Scheidenberger, C, L'Hoir, A, Andersen, J U, Andriamonje, Samuel A, Böckstiegel, C, Chevallier, M, Cohen, C, Cue, N, Czajkowski, S, Forster, J S, Geissel, H, Irnich, H, Kandler, T, Kirsch, R, Magel, A, Mokler, P H, Münzenberg, G, Nickel, F, Pivovarov, Yu L, Poizat, J C, Politis, M F, Rémillieux, Joseph, Schmaus, D, Stöhlker, T, Suzuki, T, Toulemonde, M
Publicado 1999