Resistive switching in optoelectronic III-V materials based on deep traps

por Schnedler, M., Portz, V., Semmler, U., Moors, M., Waser, R., Dunin-Borkowski, R. E., Ebert, Ph.
Publicado 2018

Non-topographic current contrast in scanning field emission microscopy

por Bertolini, G., Gürlü, O., Pröbsting, R., Westholm, D., Wei, J., Ramsperger, U., Zanin, D. A., Cabrera, H., Pescia, D., Xanthakis, J. P., Schnedler, M., Dunin-Borkowski, R. E.
Publicado 2021