Surface scattering mechanisms of tantalum nitride thin film resistor

por Chen, Huey-Ru, Chen, Ying-Chung, Chang, Ting-Chang, Chang, Kuan-Chang, Tsai, Tsung-Ming, Chu, Tian-Jian, Shih, Chih-Cheng, Chuang, Nai-Chuan, Wang, Kao-Yuan
Publicado 2014

Mechanisms of Low-Temperature Nitridation Technology on a TaN Thin Film Resistor for Temperature Sensor Applications

por Chen, Huey-Ru, Chen, Ying-Chung, Chang, Ting-Chang, Chang, Kuan-Chang, Tsai, Tsung-Ming, Chu, Tian-Jian, Shih, Chih-Cheng, Chuang, Nai-Chuan, Wang, Kao-Yuan
Publicado 2016

Comparison of physical electrical conductivity and acupuncture de-qi sensation between stainless steel needling and supercritical fluid-treated needling

por Wang, Ting-Hao, Wang, Ming-Hui, Shih, Chih-Cheng, Lu, Ying-Hsin, Zheng, Hao-Xuan, Tseng, Yi-Ting, Hu, Wen-Long, Chang, Ting-Chang, Hung, Yu-Chiang
Publicado 2021

Conduction Mechanism and Improved Endurance in HfO(2)-Based RRAM with Nitridation Treatment

por Yuan, Fang-Yuan, Deng, Ning, Shih, Chih-Cheng, Tseng, Yi-Ting, Chang, Ting-Chang, Chang, Kuan-Chang, Wang, Ming-Hui, Chen, Wen-Chung, Zheng, Hao-Xuan, Wu, Huaqiang, Qian, He, Sze, Simon M.
Publicado 2017

Physical and chemical mechanisms in oxide-based resistance random access memory

por Chang, Kuan-Chang, Chang, Ting-Chang, Tsai, Tsung-Ming, Zhang, Rui, Hung, Ya-Chi, Syu, Yong-En, Chang, Yao-Feng, Chen, Min-Chen, Chu, Tian-Jian, Chen, Hsin-Lu, Pan, Chih-Hung, Shih, Chih-Cheng, Zheng, Jin-Cheng, Sze, Simon M
Publicado 2015

High performance of graphene oxide-doped silicon oxide-based resistance random access memory

por Zhang, Rui, Chang, Kuan-Chang, Chang, Ting-Chang, Tsai, Tsung-Ming, Chen, Kai-Huang, Lou, Jen-Chung, Chen, Jung-Hui, Young, Tai-Fa, Shih, Chih-Cheng, Yang, Ya-Liang, Pan, Yin-Chih, Chu, Tian-Jian, Huang, Syuan-Yong, Pan, Chih-Hung, Su, Yu-Ting, Syu, Yong-En, Sze, Simon M
Publicado 2013