An Early Detection Circuit for Endurance Enhancement of Backfilled Contact Resistive Random Access Memory Array

por Kao, Yun-Feng, Shih, Jiaw-Ren, Lin, Chrong Jung, King, Ya-Chin
Publicado 2021

Detectors Array for In Situ Electron Beam Imaging by 16-nm FinFET CMOS Technology

por Wang, Chien-Ping, Lin, Burn Jeng, Shih, Jiaw-Ren, Chih, Yue-Der, Chang, Jonathan, Lin, Chrong Jung, King, Ya-Chin
Publicado 2021

Embedded Micro-detectors for EUV Exposure Control in FinFET CMOS Technology

por Wang, Chien-Ping, Lin, Burn Jeng, Wu, Pin-Jiun, Shih, Jiaw-Ren, Chih, Yue-Der, Chang, Jonathan, Lin, Chrong Jung, King, Ya-Chin
Publicado 2022