Bunch Length Measurements at the SLS Linac using Electro-optical Techniques

por Winter, Axel, Tonutti, Manfred, Casalbuoni, Sara, Schmüser, Peter, Simrock, Stefan, Steffen, Bernd, Korhonen, Timo, Schilcher, Thomas, Schlott, Volker, Sigg, Hans, Suetterlin, Daniel
Publicado 2004

Silicon carbide X-ray beam position monitors for synchrotron applications

por Nida, Selamnesh, Tsibizov, Alexander, Ziemann, Thomas, Woerle, Judith, Moesch, Andy, Schulze-Briese, Clemens, Pradervand, Claude, Tudisco, Salvatore, Sigg, Hans, Bunk, Oliver, Grossner, Ulrike, Camarda, Massimo
Publicado 2019

Scanning X-ray strain microscopy of inhomogeneously strained Ge micro-bridges

por Etzelstorfer, Tanja, Süess, Martin J., Schiefler, Gustav L., Jacques, Vincent L. R., Carbone, Dina, Chrastina, Daniel, Isella, Giovanni, Spolenak, Ralph, Stangl, Julian, Sigg, Hans, Diaz, Ana
Publicado 2014

Advanced GeSn/SiGeSn Group IV Heterostructure Lasers

por von den Driesch, Nils, Stange, Daniela, Rainko, Denis, Povstugar, Ivan, Zaumseil, Peter, Capellini, Giovanni, Schröder, Thomas, Denneulin, Thibaud, Ikonic, Zoran, Hartmann, Jean‐Michel, Sigg, Hans, Mantl, Siegfried, Grützmacher, Detlev, Buca, Dan
Publicado 2018