X-ray reflecto-interferometer based on compound refractive lenses

por Lyatun, S., Zverev, D., Ershov, P., Lyatun, I., Konovalov, O., Snigireva, I., Snigirev, A.
Publicado 2019

Dark-field X-ray microscopy for multiscale structural characterization

por Simons, H., King, A., Ludwig, W., Detlefs, C., Pantleon, W., Schmidt, S., Snigireva, I., Snigirev, A., Poulsen, H. F.
Publicado 2015

Corrigendum: Dark-field X-ray microscopy for multiscale structural characterization

por Simons, H., King, A., Ludwig, W., Detlefs, C., Pantleon, W., Schmidt, S., Stöhr, F., Snigireva, I., Snigirev, A., Poulsen, H. F.
Publicado 2015