In situ TEM observation of void formation and migration in phase change memory devices with confined nanoscale Ge(2)Sb(2)Te(5)

por Oh, Sang Ho, Baek, Kyungjoon, Son, Sung Kyu, Song, Kyung, Oh, Jang Won, Jeon, Seung-Joon, Kim, Won, Yoo, Jong Hee, Lee, Kee Jeung
Publicado 2020