New Conceptional Study of a Portable Highly Sensitive Photometric Raman Sensor

por Manser, Steffen, Kommert, Sandy, Keck, Shaun, Spoor, Erik, Rädle, Matthias
Publicado 2022

Incremental Learning in Modelling Process Analysis Technology (PAT)—An Important Tool in the Measuring and Control Circuit on the Way to the Smart Factory

por Choudhary, Shivani, Herdt, Deborah, Spoor, Erik, García Molina, José Fernando, Nachtmann, Marcel, Rädle, Matthias
Publicado 2021