Evidence of dislocation cross-slip in MAX phase deformed at high temperature

por Guitton, Antoine, Joulain, Anne, Thilly, Ludovic, Tromas, Christophe
Publicado 2014

Size-induced twinning in InSb semiconductor during room temperature deformation

por Mignerot, Florent, Kedjar, Bouzid, Bahsoun, Hadi, Thilly, Ludovic
Publicado 2021

In situ compression of micropillars under coherent X-ray diffraction: a case study of experimental and data-analysis constraints

por Godard, Pierre, Verezhak, Mariana, Sadat, Tarik, Mignerot, Florent, Jacques, Vincent L. R., Le Bolloc’h, David, Richter, Carsten, Berenguer, Felisa, Diaz, Ana, Van Petegem, Steven, Renault, Pierre-Olivier, Thilly, Ludovic
Publicado 2023

Revealing the role of microstructure architecture on strength and ductility of Ni microwires by in-situ synchrotron X-ray diffraction

por Purushottam raj purohit, Ravi raj purohit, Arya, Abhinav, Bojjawar, Girish, Pelerin, Maxime, Van Petegem, Steven, Proudhon, Henry, Mukherjee, Soham, Gerard, Céline, Signor, Loïc, Mocuta, Cristian, Casati, Nicola, Suwas, Satyam, Chokshi, Atul H., Thilly, Ludovic
Publicado 2019