Reliability Analysis of Ethernet-Based Solutions for Data Transmission in the CERN Radiation Environment

por Gnemmi, G, Tsiligiannis, G, Masi, A, Danzeca, S
Publicado 2020

Reliability analysis of a 65nm Rad-Hard SRAM-Based FPGA for CERN applications

por Tsiligiannis, G, Debarge, C, Le Mauff, J, Masi, A, Danzeca, S
Publicado 2019

Soft errors in commercial off-the-shelf static random access memories

por Dilillo, L, Tsiligiannis, G, Gupta, V, Bosser, A, Saigne, F, Wrobel, F
Publicado 2017

Analyzing the impact of radiation-induced failures in flash-based APSoC with and without fault tolerance techniques at CERN environment

por Tambara, L A, Chielle, E, Kastensmidt, F L, Tsiligiannis, G, Danzeca, S, Brugger, M, Masi, A
Publicado 2017

Radiation Effects on Deep Submicrometer SRAM-based FPGAs under the CERN Mixed-Field Radiation Environment

por Tsiligiannis, G, Danzeca, S, Garcia-Alia, R, Infantino, A, Lesea, A, Brugger, M, Masi, A, Gilardoni, S, Saigné, F
Publicado 2018

Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

por Bosser, A, Gupta, V, Tsiligiannis, G, Javanainen, A, Kettunen, H, Puchner, H, Saigne, F, Virtanen, A, Wrobel, F, Dilillo, L
Publicado 2015

Heavy-Ion Radiation Impact on a 4Mb FRAM under Different Test Conditions

por Gupta, V., Bosser, A., Tsiligiannis, G., Zadeh, A., Javanainen, A., Virtanen, A., Puchner, H., Saigne, F., Wrobel, F., Dilillo, L.
Publicado 2015

Evaluating a radiation monitor for mixed-field environments based on SRAM technology

por Tsiligiannis, G, Dilillo, L, Bosio, A, Girard, P, Pravossoudovitch, S, Todri, A, Virazel, A, Mekki, J, Brugger, M, Wrobel, F, Saigne, F
Publicado 2014

An SRAM Based Monitor for Mixed-Field Radiation Environments

por Tsiligiannis, G, Dilillo, L, Bosio, A, Girard, P, Pravossoudovitch, S, Todri, A, Virazel, A, Mekki, J, Brugger, M, Wrobel, F, Saigné, F
Publicado 2014

Compendium of Radiation-Induced Effects for Candidate Particle Accelerator Electronics

por Danzeca, S, Peronnard, P, Foucard, G, Tsiligiannis, G, Secondo, R, Ferraro, R, McAllister, C G, Borel, T, Brugger, M, Masi, A, Gilardoni, S
Publicado 2017

SEE on Different Layers of Stacked-SRAMs

por Gupta, V, Bosser, A, Tsiligiannis, G, Rousselet, M, Mohammadzadeh, A, Javanainen, A, Virtanen, A, Puchner, H, Saigné, F, Wrobel, F, Dilillo, L
Publicado 2015

2018 Compendium of Radiation-Induced Effects for Candidate Particle Accelerator Electronics

por Danzeca, Salvatore, Foucard, G, Tsiligiannis, G, Ferraro, R, Piscopo, G, McAllister, C G, Borel, T, Peronnard, P, Brugger, M, Masi, A, Gilardoni, S
Publicado 2018

A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing

por Bosser, A., Gupta, V., Tsiligiannis, G., Ferraro, R., Frost, C., Javanainen, A., Puchner, H., Rossi, M., Saigne, F., Virtanen, A., Wrobel, F., Zadeh, A., Dilillo, L.
Publicado 2015

Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random-Access Memory

por Bosser, A L, Gupta, V, Javanainen, A, Tsiligiannis, G, La Lumondiere, S D, Brewe, D, Ferlet-Cavrois, V, Puchner, H, Kettunen, H, Gil, T, Wrobel, F, Saigné, F, Virtanen, A, Dilillo, L
Publicado 2018